Spectroscopic diagnostics on low aspect-ratio tokamaks

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dc.contributor.authorStutman, Dko
dc.contributor.authorHwang, Yong-Seokko
dc.contributor.authorOno, Mko
dc.contributor.authorFinkenthal, Mko
dc.contributor.authorMoos, HWko
dc.date.accessioned2013-02-28T03:40:21Z-
dc.date.available2013-02-28T03:40:21Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1996-05-
dc.identifier.citationJOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, v.80, pp.249 - 254-
dc.identifier.issn0368-2048-
dc.identifier.urihttp://hdl.handle.net/10203/72581-
dc.description.abstractLow aspect-ratio tokamaks (LARTs) have intrinsic features which require specific diagnostics for particle transport and confinement studies. Such spectroscopic diagnostics are developed in collaboration between the CDX-U group at Princeton Plasma Physics Laboratory and the Plasma Spectroscopy group at Johns Hopkins University. This paper presents results obtained from the low aspect-ratio CDX-U tokamak, as well as future diagnostic developments for CDX-U and other LARTs. These results are based on spectroscopy in the VUV (500 Angstrom - 2000 Angstrom) using a multiple grating normal incidence spectrometer equipped with an optical multichannel analyzer, and in the XUV range on emission recorded using multilayer minor devices.-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE BV-
dc.titleSpectroscopic diagnostics on low aspect-ratio tokamaks-
dc.typeArticle-
dc.identifier.wosidA1996VA96200061-
dc.type.rimsART-
dc.citation.volume80-
dc.citation.beginningpage249-
dc.citation.endingpage254-
dc.citation.publicationnameJOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA-
dc.identifier.doi10.1016/0368-2048(96)02968-4-
dc.contributor.localauthorHwang, Yong-Seok-
dc.contributor.nonIdAuthorStutman, D-
dc.contributor.nonIdAuthorOno, M-
dc.contributor.nonIdAuthorFinkenthal, M-
dc.contributor.nonIdAuthorMoos, HW-
dc.type.journalArticleArticle; Proceedings Paper-
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