Synthesis of fault-tolerant supervisor for automated manufacturing systems: A case study on photolithographic process

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dc.contributor.authorCho, Kwang-Hyunko
dc.contributor.authorLim, Jong-Taeko
dc.date.accessioned2013-02-28T01:25:11Z-
dc.date.available2013-02-28T01:25:11Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1998-04-
dc.identifier.citationIEEE TRANSACTIONS ON ROBOTICS AND AUTOMATION, v.14, no.2, pp.348 - 351-
dc.identifier.issn1042-296X-
dc.identifier.urihttp://hdl.handle.net/10203/72013-
dc.description.abstractIn this paper, a discrete event dynamic system (DEDS) approach is utilized to improve the reliability of a system from the fault-tolerance viewpoint. We propose a systematic way to classify faults and failures quantitatively and to find tolerable fault event sequences embedded in DEDS's. After this, the synthesis of a fault-tolerant supervisory control system is investigated. A case study of a photolithographic process in a semiconductor manufacturing system is provided to illustrate these techniques.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectDISCRETE-EVENT SYSTEMS-
dc.titleSynthesis of fault-tolerant supervisor for automated manufacturing systems: A case study on photolithographic process-
dc.typeArticle-
dc.identifier.wosid000072855600016-
dc.identifier.scopusid2-s2.0-0032048390-
dc.type.rimsART-
dc.citation.volume14-
dc.citation.issue2-
dc.citation.beginningpage348-
dc.citation.endingpage351-
dc.citation.publicationnameIEEE TRANSACTIONS ON ROBOTICS AND AUTOMATION-
dc.contributor.localauthorCho, Kwang-Hyun-
dc.contributor.localauthorLim, Jong-Tae-
dc.type.journalArticleArticle-
dc.subject.keywordAuthordiscrete event dynamic systems-
dc.subject.keywordAuthorfault-tolerance-
dc.subject.keywordAuthorphotolithographic process-
dc.subject.keywordAuthorsupervisor-
dc.subject.keywordPlusDISCRETE-EVENT SYSTEMS-
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