인쇄회로기판의 통전검사를 위한 가변순응력을 갖는 프로브시스템A Variably Compliable Probe System for the In-Circuit of a PCB
- Publisher
- 제어,자동화,시스템공학회
- Issue Date
- 1997-06
- Language
- Korean
- Citation
제어,자동화,시스템공학 논문지, v.3, no.3, pp.323 - 331
- Appears in Collection
- ME-Journal Papers(저널논문)
- Files in This Item
- There are no files associated with this item.
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