Enhanced Reflectance X-ray Absorption Fins Structure Sensitivity Using a Whispering-Gallery Waveguide

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dc.contributor.authorv. a. chernovko
dc.contributor.authorKim, Sang-Koogko
dc.contributor.authorn. v. kovalenkoko
dc.contributor.authork. v. zolotarevko
dc.date.accessioned2013-02-27T20:45:42Z-
dc.date.available2013-02-27T20:45:42Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2000-
dc.identifier.citationNUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH, SECTION A: ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT, v.448, pp.173 - 178-
dc.identifier.issn0168-9902-
dc.identifier.urihttp://hdl.handle.net/10203/70758-
dc.languageEnglish-
dc.publisherElsevier BV-
dc.titleEnhanced Reflectance X-ray Absorption Fins Structure Sensitivity Using a Whispering-Gallery Waveguide-
dc.typeArticle-
dc.type.rimsART-
dc.citation.volume448-
dc.citation.beginningpage173-
dc.citation.endingpage178-
dc.citation.publicationnameNUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH, SECTION A: ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT-
dc.contributor.localauthorKim, Sang-Koog-
dc.contributor.nonIdAuthorv. a. chernov-
dc.contributor.nonIdAuthorn. v. kovalenko-
dc.contributor.nonIdAuthork. v. zolotarev-
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