Molecular orbital studies of bonding characters of Al-N, Al-C, and N-C bonds in organometallic precursors to AlN thin films

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Electronic structures and properties of the organometallic precursors [Me2AlNHR](2) (R = Me, Pr-i, and Bu-t) have been calculated by the semiempirical (ASED-MO, MNDO, AM1 and PM3) methods. Optimized structures obtained from the MNDO, AM1, and PM3 calculations indicate that the N-C bond lengths are considerably affected by the change of the R groups bonded to nitrogen, but the bond lengths of the Al-N and Al-C bonds are little affected. This result is useful in explaining the experimental results for the elimination of the R groups bonded to nitrogen, and could serve as a guide in designing an optimum precursor for the AN thin film formation.
Publisher
KOREAN CHEMICAL SOC
Issue Date
1998-12
Language
English
Article Type
Article
Keywords

MAGNETIC-RESONANCE SPECTRA; CHEMICAL-VAPOR-DEPOSITION; ALUMINUM NITRIDE FILMS; AIN; CRYSTAL; SEMICONDUCTORS; COMPLEXES; MECHANISM; GROWTH; GAN

Citation

BULLETIN OF THE KOREAN CHEMICAL SOCIETY, v.19, no.12, pp.1314 - 1319

ISSN
0253-2964
URI
http://hdl.handle.net/10203/70587
Appears in Collection
CH-Journal Papers(저널논문)
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