Browse "College of Engineering(공과대학)" by Subject OXIDE SEMICONDUCTOR
Showing results 1 to 4 of 4
| Comparative studies on electrical bias temperature instabilities of In-Ga-Zn-O thin film transistors with different device configurations Ryu, Min-Ki; Park, Sang-Hee Ko; Hwang, Chi-Sun; Yoon, Sung-Min, SOLID-STATE ELECTRONICS, v.89, pp.171 - 176, 2013-11 |
| Discharge Current Analysis Estimating the Defect Sites in Amorphous Hafnia Thin-Film Transistor Goh, Youngin; Jeon, Sanghun, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.8, pp.3264 - 3268, 2018-08 |
| Light and bias stability of a-IGZO TFT fabricated by r.f. magnetron sputtering Huh, Jun-Young; Seo, Seung-Bum; Park, Han-Sung; Jeon, Jae-Hong; Choe, Hee-Hwan; Lee, Kang-Woong; Seo, Jong-Huyn; et al, CURRENT APPLIED PHYSICS, v.11, no.5, pp.49 - 53, 2011-09 |
| TFT Channel Materials for Display Applications: From Amorphous Silicon to Transition Metal Dichalcogenides Shim, Gi Woong; Hong, Woonggi; Cha, Jun-Hwe; Park, Jung Hwan; Lee, Keon Jae; Choi, Sung-Yool, ADVANCED MATERIALS, v.32, no.35, pp.1907133, 2020-09 |
Discover
Open Access
Date issued
- 23,862 2020 - 2024
- 75,429 2010 - 2019
- 57,255 2000 - 2009
- 30,842 1990 - 1999
- 9,025 1980 - 1989