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Effect of Mg insertion on stress-induced resistance drift in MgO-based magnetic tunnel junctions Choi, Chulmin; Oh, Y. T.; Lee, Jeong Yong; Sukegawa, Hiroaki; Mitani, Seiji; Song, Yunheub, ELECTRONICS LETTERS, v.52, no.7, pp.531 - 532, 2016-04 |
Statistical Characterization of Noise and Interference in NAND Flash Memory Moon, Jaekyun; No, Jaehyeong; Lee, Sangchul; Kim, Sangsik; Choi, Seokhwan; Song, Yunheub, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.60, no.8, pp.2153 - 2164, 2013-08 |
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