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Evidence of Al induced conducting filament formation in Al/amorphous silicon/Al resistive switching memory device Seo, Jung Won; Baik, Seung Jae; Kang, Sang Jung; Hong, Yun Ho; Yang, Ji-Hwan; Fang, Liang; Lim, Koeng Su, APPLIED PHYSICS LETTERS, v.96, no.5, 2010-02 |
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