Showing results 1 to 4 of 4
Automatic Test Case Generation Using Multi-protocol Test Method Lee, Soo-In; Park, Yongbum; Youn, Hee Yong; Kim, Myungchul; Lee, Ben, IEEE Ninth International Conference on Computer Communications and Networks, pp.360 - 366, IEEE, 2000 |
Conformance Testing of Multi-protocol IUTs Park, Yongbum; Kim, Myungchul; Kang, Sungwon, IWTCS, 1999 |
Interoperability Test Suite Derivation for the TCP Seol, Soonuk; Kim, Myungchul; Kang, Sungwon; Park, Yongbum; Choe, Younghan, FORTE/PSTV, pp.357 - 376, 1997 |
Long lasting electrocatalyst with graphene and graphitized carbon supports for PEMFC application Kim, Hee-Tak; Kim, Jung Young; Lee, Sungchunl; Park, Yongbum; Kim, Yeon Su; Kim, Tae Yoon; Park, Chan Ho, 2013 MRS Fall Meeting, Materials Research Society, 2013-12-02 |
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