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High-Performance Field-Effect Transistor and Logic Gates Based on GaS-MoS(2 )van der Waals Heterostructure Shin, Gwang Hyuk; Lee, Geon-Beom; An, Eun-Su; Park, Cheolmin; Jin, Hyeok Jun; Lee, Khang June; Oh, Dong-Sik; et al, ACS APPLIED MATERIALS & INTERFACES, v.12, no.4, pp.5106 - 5112, 2020-01 |
Negative Bias Illumination Stress(NBIS) Stability Analysis of MoS2 Thin-Film Transistor(TFT) Oh, Dong-Sik; Kang, Ju-Yeon; Park, Hamin; Shin, Gwang-Hyuk; Hong, Woonggi; Im, Sung-Gap; Choi, Sung-Yool, RPGR 2019: Recent Progress in Graphene and Two-dimensional Materials Research Conference, Recent Progress in Graphene and Two-dimensional Materials Research, 2019-10-08 |
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