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Showing results 1 to 3 of 3

1
Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Using Convolutional Neural Networks

Kyeong, Kiryong; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.31, no.3, pp.395 - 402, 2018-08

2
Classification of mixed-type defects patterns in wafer bin maps using convolutional neural networks = Convolutional neural networks를 이용한 반도체 웨이퍼빈맵의 혼합된 형태의 결함 패턴 분류link

Kyeong, Kiryong; Kim, Heeyoung; et al, 한국과학기술원, 2018

3
Industrial Engineering Education using KAIST LEGO Manufacturing Systems (KLMS)

Jang, Young Jae; Yosephine, Vina Sari; Oh, Sun Kyung; Cho, Sukhyun; Kyeong, Kiryong, Asia Pacific Industrial Engineering & Management Systems Conference, Asia Pacific Industrial Engineering and Management Society, 2014-10-15

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