Showing results 18 to 20 of 20
SRAF printing prediction using artificial neural network Kwon, Yonghwi; Yang, Jinho; Kim, Sungho; Kim, Cheolkyun; Shin, Youngsoo, Conference on Optical Microlithography XXXIII, SPIE, 2020-02-25 |
Test pattern extraction for lithography modeling under design rule revisions Cho, Gangmin; Kwon, Yonghwi; Kareem, Pervaiz; Kim Sungho; Shin, Youngsoo, Conference on Optical Microlithography XXXIV, SPIE, 2021-02-21 |
Transient clock power estimation of pre-CTS netlist Kwon, Yonghwi; Jung, Jinwook; Han, In-Hak; Shin, Youngsoo, IEEE International Symposium on Circuits & Systems, Institute of Electrical and Electronics Engineers, 2018-05-27 |
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