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Quantitative Observation of Threshold Defect Behavior in Memristive Devices with Operando X-ray Microscopy Liu, Huajun; Dong, Yongqi; Cherukara, Mathew J.; Sasikumar, Kiran; Narayanan, Badri; Cai, Zhonghou; Lai, Barry; et al, ACS NANO, v.12, no.5, pp.4938 - 4945, 2018-05 |
Recent Advances and Future Prospects for Memristive Materials, Devices, and Systems Song, Min-Kyu; Kang, Ji-Hoon; Zhang, Xinyuan; Ji, Wonjae; Ascoli, Alon; Messaris, Ioannis; Demirkol, Ahmet Samil; et al, ACS NANO, v.17, no.13, pp.11994 - 12039, 2023-07 |
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