Browse "College of Engineering(공과대학)" by Type Conference

Showing results 59021 to 59040 of 91048

59021
Reference SAW oscillator on Quartz-on-Silicon (QoS) wafer for polylithic integration of true single chip radio

Eo, Yunseong; Hyun, Seokbong; Choi, Pilsoon; Lee, Kwyro; Oh, Gilhwan; Lee, Joong-Won, 1999 IEEE International Devices Meeting (IEDM), pp.761 - 764, IEEE, 1999-12-05

59022
Reference signal modification for fast convergence in LMS-based adaptive equalizers

Lee, G.H.; Choi, J.; Park, R.-H.; Song, Iickho; Song, G.W.; Park, J.H.; Lee, B.-U., pp.376 - 381, IEEE, 1994-11

59023
Reference-Atlas-based 3-D reconstruction of the mouse brain from 2-D slice images

송준호; 송유향; 이승희; 백세범, 20th Korean Society for Brain and Neural Science Annual Meeting, The Korean Society for Brain and Neural Sciences, 2017-08-31

59024
Reference-free approaches for structural health monitoring

Sohn, Hoon, CIMTEC 2008: 3rd International Conference on Smart Materials, Structures and Systems, CIMTEC, 2008-06-08

59025
Reference-free Coating Thickness Quantification using Laser Thermography under Various Exterior Temperature Conditions

Hwang, Soonkyu; Park, Jiho; Jin, Z.; Sohn, Hoon, 14th Quantitative Infrared Thermography Conference (QIRT), pp.369 - 375, Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP, 2018-06-26

59026
Reference-free deflection measurement of general-shape bridges using data fusion

Cho, Soojin; Yun, Chung-Bang; Sim, Sung Han, Joint 6th International Conference on Advances in Experimental Structural Engineering, AESE 2015 and 11th International Workshop on Advanced Smart Materials and Smart Structures Technology, ANCRiSST 2015, EUCENTRE, 2015-08

59027
Reference-free delamination detection, localization and quantification using a matching pursuit technique

Lim, Hyung Jin; Sohn, Hoon, Engineering Mechanics Institute Conference, ASCE, 2011-06-02

59028
Reference-free delamination quantification within multi-layer composite materials

Lim, Hyung Jin; Sohn, Hoon, KSNT Spring Conference, KSNT, 2011-05-26

59029
Reference-free EPI Nyquist ghost correction using annihilating filter-based low rank hankel matrix for K-space interpolation

Lee, Juyoung; Jin, Kyong Hwan; Ye, Jong Chul, IEEE International Symposium on Biomedical Imaging: From Nano to Macro, ISBI 2016, IEEE, 2016-04-16

59030
Reference-free Fatigue Crack Detection using Nonlinear Wave Modulation

Lim, Hyung Jin; Sohn, Hoon; DeSimio, Martin P; Brown, Kevin; Merriso, Mark, 9th International Workshop on Structural Health Monitoring, Cambridge Centre for Smart Infrastructure and Construction, 2013-09-10

59031
Reference-free impedance based structural health monitoring

Park, Seung Hee; Lee, Chang Gil; Sohn, Hoon, The 4th International Workshop on Advanced Smart Materials and Smart Structures Technology, ANCRiSST, 2008-06-24

59032
Reference-free impedance-based crack detection in plate-like structures

Kim, M.; Kim, E.; Park, H.; Sohn, Hoon, Health Monitoring of Structural and Biological Systems 2010, SPIE, 2010-03-08

59033
Reference-free piezoelectric transducer self-diagnosis scheme development using guided wave propagation for structural health monitoring systems

Lee, Sang Jun; Sohn, Hoon, The 6th International Workshop on Structural Health Monitoring, SHM, 2007-09

59034
Reference-free structural dynamic displacement measurement via sigle-rate data fusion of velocity and acceleration records

Choi, Jaemook; Kim, Kiyoung; Koo, Gunhee; Sohn, Hoon, 대한토목학회 2016 컨벤션, 대한토목학회, 2016-10-19

59035
Reference-free structural health monitoring for detecting delamination in composite plates

Yeum, Chul Min; Sohn, Hoon; Ihn, Jeong Beom, The 8th International Workshop on Structural Health Monitoring, Structural Health Monitoring, 2011-09-13

59036
Reference-free transducer and system diagnosis and beyond

Sohn, Hoon; Greve, David W.; Oppenheim, Irving J.; Kim, Seung Bum; Lee, Sang Jun; Kim, Seung Dae; Boscha, Anand, SPIE International Symposia, Smart Structures & Materials and Nondestructive Evaluation for Health Monitoring and Diagnostics, SPIE, 2007-03-18

59037
Reference-source-free timing jitter measurement of a mode-locked laser using a fiber delay line

Jung, Kwangyun; Kim, Jungwon, 2015 Joint Conference of the IEEE International Frequency Control Symposium & European Frequency and Time Forum (IFCS/EFTF), IEEE, 2015-04-14

59038
Refine Myself by Teaching Myself : Feature Refinement via Self-Knowledge Distillation

Ji, Mingi; Shin, Seungjae; Hwang, Seunghyun; Park, Gibeom; Moon, Il-Chul, IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2021, pp.10659 - 10668, IEEE Computer Vision and Pattern Recognition, 2021-06-19

59039
Refine pedestrian detections by referring to features in different ways

Lee, Jaemyung; Lee, Sihaeng; Kim, Youngdong; Lee, Janghyeon; Kim, Junmo, 28th IEEE Intelligent Vehicles Symposium, IV 2017, pp.418 - 423, Institute of Electrical and Electronics Engineers Inc., 2017-06

59040
ReFine: Re-randomization before Fine-tuning for Cross-domain Few-shot Learning

Oh, Jae Hoon; Kim, Sungnyun; Ho, Namgyu; Kim, Jin-Hwa; Song, Hwanjun; Yun, Seyoung, 31st ACM International Conference on Information and Knowledge Management, CIKM 2022, pp.4359 - 4363, ACM, 2022-10-19

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