Showing results 38201 to 38220 of 63138
Optical performance monitoring of QPSK data channels by use of neural networks trained with parameters derived from asynchronous constellation diagrams Jargon, Jeffrey A.; Wu, Xiaoxia; Choi, Hyeon Yeong; Chung, Yun Chur; Willner, Alan E., OPTICS EXPRESS, v.18, no.5, pp.4931 - 4938, 2010-03 |
Optical performance monitoring technique using asynchronous amplitude and phase histograms Choi, H. Y.; Takushima, Y.; Chung, Yun Chur, OPTICS EXPRESS, v.17, no.26, pp.23953 - 23958, 2009-12 |
Optical performance monitoring technique using software-based synchronous amplitude histograms Choi, Hyeok Gyu; Chang, J. H.; Kim, Hoon; Chung, Yun Chur, OPTICS EXPRESS, v.22, no.20, pp.24024 - 24033, 2014-10 |
Optical performance monitoring techniques based on pilot tones for WDM network applications Ji, H.; Park, K.; Lee, J.; Chung, H.; Son, E.; Han, K.; Jun, S.; et al, JOURNAL OF OPTICAL NETWORKING, v.3, no.7, pp.510 - 533, 2004 |
Optical phase conjugation (OPC)-assisted isotropic focusing Jang, Mooseok; Sentenac, Anne; Yang, Changhuei, OPTICS EXPRESS, v.21, no.7, pp.8781 - 8792, 2013-04 |
Optical phase conjugation assisted scattering lens: variable focusing and 3D patterning Ryu, Jihee; Jang, Mooseok; Eom, Tae Joong; Yang, Changhuei; Chung, Euiheon, SCIENTIFIC REPORTS, v.6, 2016-04 |
Optical Phase Conjugation with Less Than a Photon per Degree of Freedom Jang, Mooseok; Yang, C; Vellekoop, IM, PHYSICAL REVIEW LETTERS, v.118, no.9, 2017-03 |
Optical phase estimation for a patch-type extrinsic Fabry-Perot interferometer sensor system and its application to flutter suppression Kim, DH; Chang, YH; Han, Jae-Hung; Lee, In, SMART MATERIALS & STRUCTURES, v.14, no.4, pp.696 - 706, 2005-08 |
Optical polarization perturbed by shear strains of ultrasonic bulk waves in anisotropic semiconductors: Multiphysics modeling and optoacoustic validation He, Yi; Sohn, Hoon; Matsuda, Osamu; Su, Zhongqing, PHOTOACOUSTICS, v.32, 2023-08 |
Optical properties and characteristics of the CdSe nanoparticles synthesized at room temperature Suh, DJ; Park, OOk; Jung, HeeTae; Kwon, MH, KOREAN JOURNAL OF CHEMICAL ENGINEERING, v.19, no.3, pp.529 - 533, 2002-05 |
Optical Properties of Fluorescein-labeled Organoclay Lee, Young-Chul; Lee, Tae-Ho; Han, Hyo-Kyung; Go, Woon-Jung; Yang, Ji-Won; Shin, Hyun-Jae, PHOTOCHEMISTRY AND PHOTOBIOLOGY, v.86, no.3, pp.520 - 527, 2010-05 |
Optical properties of Si-O-N-F films as a phase shift mask material for 157 nm optical lithography Kim, SK; Kang, MA; Sohn, JM; Kim, SH; No, Kwangsoo, OPTICAL MATERIALS, v.22, no.4, pp.361 - 367, 2003-06 |
Optical properties of SiOx nanostructured films by pulsed-laser deposition at different substrate temperatures Chen, XY; Lu, YF; Wu, YH; Cho, Byung Jin; Song, WD; Dai, DY, JOURNAL OF APPLIED PHYSICS, v.96, no.6, pp.3180 - 3186, 2004-09 |
Optical Properties of Tetrahydrofuran Clathrate Hydrates with Polyvinylpyrrolidone (THF + H2O + PVP) Revealed by Terahertz (THz) Time-Domain Spectroscopy Kang, Hyery; Koh, Dong-Yeun; Ahn, Yun-Ho; Jung, Seonghoon; Park, Jaehun; Lee, Jaehyoung; Lee, Huen, JOURNAL OF CHEMICAL AND ENGINEERING DATA, v.60, no.2, pp.238 - 246, 2015-02 |
Optical properties of thin amorphous silicon film on a phase shift mask for 157 nm lithography Kim, SungKwan; Kim, YangSoo; Choi, YoungMin; Choi, JongWan; Hong, Jongin; Shon, JungMin; Sung, Tae-Hyun; et al, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.43, no.5A, pp.2523 - 2529, 2004-05 |
Optical Properties of WO3/Ag/WO3 Multi layer As Transparent Cathode in Top-Emitting Organic Light Emitting Diodes Hong, Kihyon; Kim, Kisoo; Kim, Sungjun; Lee, Illhwan; Cho, Hyunsu; Yoo, Seunghyup; Choi, Ho Won; et al, JOURNAL OF PHYSICAL CHEMISTRY C, v.115, no.8, pp.3453 - 3459, 2011-03 |
Optical Property Change of Silver Nanowire Thin Films in Laser Patterning Process Kim, Gun Woo; Shin, Dongsig; Yang, Minyang, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.21, no.2, pp.301 - 308, 2020-02 |
Optical property of blended plasmonic nanofluid based on gold nanorods Jeon, Jongwook; Park, Sunho; Lee, Bong Jae, OPTICS EXPRESS, v.22, no.13, pp.A1101 - A1111, 2014-06 |
Optical property simulation of single-layer halftone phaseshifting masks for DUV microlithography Jiang, ZT; Hong, Daniel Seungbum; Kim, E; Bae, Byeong-Soo; No, Kwangsoo; Hwangbo, CK; Lim, SC; et al, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.11, no.10, pp.1450 - 1455, 1996-10 |
Optical Proximity Correction Using Bidirectional Recurrent Neural Network With Attention Mechanism Kwon, Yonghwi; Shin, Youngsoo, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.34, no.2, pp.168 - 176, 2021-05 |
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