Browse "College of Engineering(공과대학)" by Title
Showing results 148581 to 148600 of 201716
| ULH DWDM network and dispersion map design Rhee, June-Koo Kevin, Photonics Conference 2003, pp.445 - 446, 한국광학회, 2003-11 |
| ULP Receiver Design Methodologies for Wireless Sensor Network Applications Lee, Jae Seung; Kim, Joo Myoung; Han, Seok Kyun; Lee, Sang Gug, 2013 Asia-Pacific Microwave Conference, pp.92 - 94, Asia-Pacific Microwave Conference, 2013-11-06 |
| ULSAB-AVC모델의 경량화 및 충돌성능을 고려한 설계 가이드라인 개발 배기현; 허훈; 임지호; 김교성, 한국자동차공학회 2010년 부문종합 학술대회, 한국자동차공학회, 2010-05-06 |
| Ultimate Boundedness of Nonlinear Singularly Perturbed System with Measurement Noise Kang, Kyung-In; Park, Kyun-Sang; Lim, Jong-Tae, IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, v.E96A, no.4, pp.826 - 829, 2013-04 |
| Ultimate capacity of WDM transmission systems and networks Lee, Chang-Hee; Kim, HD, Optoelectronics and Optical Communications Conference (OECC), pp.12P-20 - 12P-20, 2000 |
| Ultimate Light Trapping in a Free-Form Plasmonic Waveguide Park, Juho; Kim, Sanmun; Lee, Joongwon; Menabde, Sergey G.; Jang, Min Seok, PHYSICAL REVIEW APPLIED, v.12, no.2, 2019-08 |
| Ultimate light trapping in the free-form MIM plasmonic waveguide Park, Juho; Kim, Sanmoon; Han, Sangjun; Ha, Heonhak; Menabde, Sergey G.; Jang, Min Seok, The 9th International Conference on Surface Plasmon Photonics, BDP Congress, 2019-05-30 |
| Ultimate light trapping in the free-form MIM plasmonic waveguide Park, Juho; Kim, Sanmoon; Lee, Joongwon; Menabde, Sergey G.; Jang, Min Seok, ICAMD 2019: The 11th International Conference on Advanced Materials and Devices, 한국물리학회, 2019-12-12 |
| Ultimate Light Trapping in the Free-Form MIM Plasmonic Waveguide Park, Juho; Kim, Sanmoon; Lee, Joongwon; Menabde, Sergey G.; Jang, Min Seok, SPIE Optics + Photonics 2019, SPIE, 2019-08-14 |
| Ultimate Load Capacity of Cft Column Considering Time Dependent Behavior Kim, SeongHun; Kwak, Hyo-Gyoung, ACEX2022(15th International Conference on Advanced Computational Engineering and Experimenting), ICC - INTERNATIONAL CONFERENCES AND COURSES LIMITED, 2022-07-06 |
| Ultimate load capacity of unit Starch frames using an explicit numerical method Lee, Kyoungsoo; Hong, Jung-Wuk; Han, Sang-Eul, STEEL AND COMPOSITE STRUCTURES, v.13, no.6, pp.539 - 560, 2012-12 |
| Ultimate Resisting Capacity of Biaxially Loaded Slender RC Column Kwak, Hyo-Gyoung; Kwak, JH, Advances on Structural Engineering and Mechanics(`ASEM08), pp.241 - 241, 2008-05 |
| Ultimate Resisting Capacity of Reinforced Concrete Members Damaged under Fire Kwak, Hyo-Gyoung; Lee, Yonghoon; Hwang, Jin-Wook; Kim, Woo-Suk; Kim, Hwa-Jung, The 25th KKCNN Symposium on Civil Engineering, KKCNN, 2012-10-23 |
| Ultimate Resisting Capacity of Slender RC Columns Kwak, Hyo-Gyoung; Kim, JK, The Fourteenth KKNN Symposium Civil Engineering, pp.341 - 346, 2001-11 |
| Ultimate resisting capacity of slender RC columns Kim, JK; Kwak, Hyo-Gyoung, COMPUTERS & STRUCTURES, v.82, no.11-12, pp.901 - 915, 2004-05 |
| Ultimate Resisting Capacity of Slender RC Columns Subject to Long-term Biaxial Bending Kwak, Hyo-Gyoung; Kwak, JH, 5th European Congress on Computational Methods in Applied Sciences and Engineering, pp.88 - 88, 2008-07 |
| Ultimate Resisting Capacity Reduction Factor in Slender RC Columns Kwak, Hyo-Gyoung; Kim, JK, Proceedings of the Fifth World Congress on Computational Mechanics, pp.570 - 570, 2002-07 |
| Ultimate resolution active matrix display with oxide TFT backplanes for electronic holographic display Hwang, Chi-Sun; Kim, Yong-Hae; Yang, Jong-Heon; Choi, Ji Hun; Pi, Jae-Eun; Kim, Gi Heon; Hwang, Chi-Young; et al, SID Symposium, Seminar, and Exhibition 2018, Display Week 2018, pp.610 - 612, Blackwell Publishing Ltd, 2018-05 |
| Ultimate Strength of RC Cooling Tower Shells Subjected to Temperature Gradient and Wind Loads Choi, Chang Koon, The First Tokyo University-KAIST Bilateral Seminar on Construction Technology, 1998 |
| Ultimately scaled 20nm unified-RAM Moon, D.-I.; Choi, S.-J.; Kim, C.-J.; Kim, J.-Y.; Lee, J.-S.; Oh, J.-S.; Lee, G.-S.; et al, 2010 IEEE International Electron Devices Meeting, IEEE, 2010-12-06 |
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