Browse "College of Engineering(공과대학)" by Type Conference
Showing results 68001 to 68020 of 91091
| Test for deterministic dynamics in EEG Jeong, Jaeseung; Kim, MS; Kim, Soo Yong, The proceeding of The fifth International Conference on Neural Information Processing (ICONIP' 98), pp.455 - 458, 1998 |
| Test for deterministic dynamics in EEG Jeong, Jaeseung; Kim, MS; Kim, Soo Yong, The 15th International Conference on Neural Information Processing, pp.455 - 458, 1998 |
| Test Generation for VMF Tactical Data Link Messages - Coping with Message Length Variability and Semantic Message Rules Lee, Jihyun; Kang, Sungwon; Ko, Kyungmin; Keum, Changsup; Kim, Myungchul; Lee, Danhyung, The IEEE 22nd International Symposium on Software Reliability Engineering (ISSRE 2011) , IEEE, 2011-11 |
| TEST OF SINGLE REFLECTIVE GRATING BASED FIBER OPTIC SENSOR DESIGN FOR MEASUREMENT OF TILT ANGLE Lee, Yeon-Gwan; Jang, Byeong-Wook; Kim, Yoon Young; Kim, DH; Kim, Chun-Gon, 18th International Conference on Composite Materials (ICCM), The Korean Society for Composite Materials, 2011-08-23 |
| Test pattern extraction for lithography modeling under design rule revisions Cho, Gangmin; Kwon, Yonghwi; Kareem, Pervaiz; Kim Sungho; Shin, Youngsoo, Conference on Optical Microlithography XXXIV, SPIE, 2021-02-21 |
| Test Pattern Generation of Combinational Circuits using Logic Decision Diagrams Lim, Jong-Tae; Lee, MS, ISIM 2000, pp.375 - 378, 2000-10 |
| Test Sequence Generation for Adaptive Interoperability Testing Kang, Sungwon; Kim, Myungchul, IFIP TC6/WG6.1 The 8th International Workshop on Protocol Test Systems (IWPTS'95), pp.193 - 206, 1995-09 |
| Test Set Diameter: Quantifying the Diversity of Sets of Test Cases Feldt, Robert; Poulding, Simon; Clark, David; Yoo, Shin, 9th IEEE International Conference on Software Testing, Verification and Validation, ICST 2016, pp.223 - 233, Institute of Electrical and Electronics Engineers Inc., 2016-04-14 |
| Test Time Elongation of the Shock Tube Using Driver Gas Staging Valve Kim, Keunyeong; Jeong, Junho; PARK, GISU, The 34th International Symposium on Shock Waves, National Symposium on Shock Waves Korea, 2023-07-17 |
| Test-Time Adaptation via Self-Training with Nearest Neighbor Information Jang, Minguk; Chung, Sae-Young; Chung, Hye Won, The International Conference on Learning Representations, ICLR 2023, The International Conference on Learning Representations (ICLR), 2023-05-01 |
| Test-Time Self-Adaptive Small Language Models for Question Answering Jeong, Soyeong; Baek, Jinheon; Cho, Sukmin; Hwang, Sung Ju; Park, Jong-Cheol, The 2023 Conference on Empirical Methods in Natural Language Processing, Association for Computational Linguistics (ACL), 2023-12-07 |
| Test-Time Style Shifting: Handling Arbitrary Styles in Domain Generalization Park, JungWuk; Han, Dong Jun; Kim, Soyeong; Moon, Jaekyun, 40th International Conference on Machine Learning, ICML 2023, pp.27114 - 27131, ML Research Press, 2023-07-26 |
| Test-Time Synthetic-to-Real Adaptive Depth Estimation Yi, Eojindl; Kim, Junmo, 2023 IEEE International Conference on Robotics and Automation, ICRA 2023, pp.4938 - 4944, Institute of Electrical and Electronics Engineers Inc., 2023-05-28 |
| Test-Time Synthetic-to-Real Adaptive Depth Estimation Yi, Eojindl; Kim, Junmo, 2023 IEEE International Conference on Robotics and Automation, ICRA 2023, pp.4938 - 4944, IEEE, 2023-05-29 |
| Testability of Safety Software Based on Specification in Statechart Sohn, Se-do; Seong, Poong-Hyun; Kim, Hang-bae; Han, Heehwan, International Conference on Nuclear Technology: Achieving Global Economic Growth While Safeguarding the Environment, pp.199, International Conference on Nuclear Technology, 2003-11-16 |
| Testing Concurrent Programs to Achieve High Synchronization Coverage Hong, Shin; Ahn, Jaemin; Park, Sangmin; Kim, Moonzoo; Harrold, Mary-Jean, International Symposium on Software Testing and Analysis, ACM, 2012-07-18 |
| Testing for Verification and Validation of COMS Satellite Kim, Hyung Wan; Ahn, Jae Myung, Asia-Pacific Conference on Systems Engineering, 한국시스템엔지니어링학회, 2015-10-13 |
| Testing Intermediate Representations for Binary Analysis Kim, Soomin; Faerevaag, Markus; Jung, Minkyu; Jung, Seungil; Oh, DongYeop; Lee, JongHyup; Cha, Sang Kil, 32nd IEEE/ACM International Conference on Automated Software Engineering (ASE), pp.353 - 364, IEEE Computer Society and ACM SIGSFOT, 2017-11-03 |
| Testing Methods for SDL Systems Chon, Kil Nam, SDL Forum, 1995 |
| Testing of Concurrent Programs After Specification Changes Chung, In Sang; Kim, Hyeon Soo; Bae, Hyun Seop; Kwon, Yong Rae; Lee, Dong Gil, International Conference on Software Maintenance (ICSM '99), pp.199 - 208, IEEE, 1999 |
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- 57,260 2000 - 2009
- 30,842 1990 - 1999
- 9,025 1980 - 1989