A New Extraction Method of Small-Signal Parameters of MOSFETs for RF Modeling

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dc.contributor.authorKwon, Ickjinko
dc.contributor.authorJe, Minkyuko
dc.contributor.authorYu, Hyun Kyuko
dc.contributor.authorShin, Hyung-Cheolko
dc.contributor.authorLee, Kwy-Roko
dc.date.accessioned2013-02-27T15:44:18Z-
dc.date.available2013-02-27T15:44:18Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2000-06-
dc.identifier.citationJOURNAL OF ELECTRICAL ENGINEERING AND INFORMATION SCIENCE, v.5, no.3, pp.291 - 295-
dc.identifier.issn1226-1262-
dc.identifier.urihttp://hdl.handle.net/10203/69414-
dc.languageKorean-
dc.publisher한국정보과학회-
dc.titleA New Extraction Method of Small-Signal Parameters of MOSFETs for RF Modeling-
dc.typeArticle-
dc.type.rimsART-
dc.citation.volume5-
dc.citation.issue3-
dc.citation.beginningpage291-
dc.citation.endingpage295-
dc.citation.publicationnameJOURNAL OF ELECTRICAL ENGINEERING AND INFORMATION SCIENCE-
dc.contributor.localauthorJe, Minkyu-
dc.contributor.localauthorShin, Hyung-Cheol-
dc.contributor.localauthorLee, Kwy-Ro-
dc.contributor.nonIdAuthorKwon, Ickjin-
dc.contributor.nonIdAuthorYu, Hyun Kyu-
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EE-Journal Papers(저널논문)RIMS Journal Papers
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