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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Noise coupling to signal trace and via from power/ground simultaneous switching noise in high speed double data rates memory module

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dc.contributor.authorPark, J.ko
dc.contributor.authorKim, H.ko
dc.contributor.authorPak, J.S.ko
dc.contributor.authorJeong, Y.ko
dc.contributor.authorBaek, S.ko
dc.contributor.authorKim, Jounghoko
dc.contributor.authorLee, J.-J.ko
dc.contributor.authorLee, J.-J.ko
dc.date.accessioned2007-06-27T03:06:30Z-
dc.date.available2007-06-27T03:06:30Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2004-08-09-
dc.identifier.citation2004 International Symposium on Electromagnetic Compatibility, EMC 2004, pp.592 - 597-
dc.identifier.issn1077-4076-
dc.identifier.urihttp://hdl.handle.net/10203/674-
dc.description.sponsorshipThis work was supported by Samsung Electronics Co., Ltd.en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherIEEE-
dc.titleNoise coupling to signal trace and via from power/ground simultaneous switching noise in high speed double data rates memory module-
dc.typeConference-
dc.identifier.wosid000223620100119-
dc.identifier.scopusid2-s2.0-4644269666-
dc.type.rimsCONF-
dc.citation.beginningpage592-
dc.citation.endingpage597-
dc.citation.publicationname2004 International Symposium on Electromagnetic Compatibility, EMC 2004-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationSanta Clara, CA-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorKim, Joungho-
dc.contributor.nonIdAuthorPark, J.-
dc.contributor.nonIdAuthorKim, H.-
dc.contributor.nonIdAuthorPak, J.S.-
dc.contributor.nonIdAuthorJeong, Y.-
dc.contributor.nonIdAuthorBaek, S.-
dc.contributor.nonIdAuthorLee, J.-J.-
dc.contributor.nonIdAuthorLee, J.-J.-
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