Effect of decoupling capacitor on signal integrity in applications with reference plane change
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, J. | - |
| dc.contributor.author | Lu, A.C.W. | - |
| dc.contributor.author | Fan, W. | - |
| dc.contributor.author | Wai, L.L. | - |
| dc.contributor.author | Kim, Joungho | - |
| dc.date.accessioned | 2007-06-26T06:33:02Z | - |
| dc.date.available | 2007-06-26T06:33:02Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2003-05-27 | - |
| dc.identifier.citation | 53rd Electronic Components and Technology Conference, 2003, v., no., pp.1283 - 1288 | - |
| dc.identifier.issn | 0569-5503 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/664 | - |
| dc.description.sponsorship | Authors would like to acknowledge the collaborative research project funding and support from Singapore Institute of Manufacturing Technology, A*STAR, and Korea Advanced Institute of Science and Technology, Terahertz Media and System Laboratory (Dept of EE and CS). | en |
| dc.language | ENG | - |
| dc.language.iso | en_US | en |
| dc.publisher | IEEE | - |
| dc.title | Effect of decoupling capacitor on signal integrity in applications with reference plane change | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-0038012339 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 1283 | - |
| dc.citation.endingpage | 1288 | - |
| dc.citation.publicationname | 53rd Electronic Components and Technology Conference, 2003 | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Kim, Joungho | - |
| dc.contributor.nonIdAuthor | Lee, J. | - |
| dc.contributor.nonIdAuthor | Lu, A.C.W. | - |
| dc.contributor.nonIdAuthor | Fan, W. | - |
| dc.contributor.nonIdAuthor | Wai, L.L. | - |
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