DC Field | Value | Language |
---|---|---|
dc.contributor.author | SangSuk Lee | ko |
dc.contributor.author | Youm, Do-Jun | ko |
dc.date.accessioned | 2013-02-27T04:26:59Z | - |
dc.date.available | 2013-02-27T04:26:59Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1993 | - |
dc.identifier.citation | PHYSICA C, v.211, no.2016-01-02, pp.205 - 208 | - |
dc.identifier.issn | 0921-4534 | - |
dc.identifier.uri | http://hdl.handle.net/10203/66444 | - |
dc.description.abstract | The X-ray diffraction (XRD) -phi scan measurement of an Y1Ba2Cu3O7-delta/CeO2/MgO/SrTiO3 multilayer revealed noticeable changes in the effect of the MgO seed layer on the crystalline orientation of the YBCO/CeO2 overlayer as the thickness of the MgO layer increased from 20 to 60 angstrom. Such a phenomenon was confirmed to originate from the thickness-dependent characteristics of the MgO seed layer itself. Another interesting property of the MgO seed layer, which was deposited by e-beam evaporation, is that the CeO2 overlayer did not grow epitaxially on it unless its surface was heat treated in an oxygen atmosphere. | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.title | EFFECTS OF THE MGO LAYER THICKNESS ON THE CRYSTALLINE ORIENTATION IN Y1BA2CU3O7-DELTA/CEO2/MGO/SRTIO3 MULTILAYER GROWTH | - |
dc.type | Article | - |
dc.identifier.wosid | A1993LH66300021 | - |
dc.type.rims | ART | - |
dc.citation.volume | 211 | - |
dc.citation.issue | 2016-01-02 | - |
dc.citation.beginningpage | 205 | - |
dc.citation.endingpage | 208 | - |
dc.citation.publicationname | PHYSICA C | - |
dc.identifier.doi | 10.1016/0921-4534(93)90742-9 | - |
dc.contributor.localauthor | Youm, Do-Jun | - |
dc.contributor.nonIdAuthor | SangSuk Lee | - |
dc.type.journalArticle | Article | - |
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