POINT-DEFECT FORMATION ON GRAPHITE SURFACE INDUCED BY ION IMPACT AT ENERGIES NEAR PENETRATION THRESHOLD

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dc.contributor.authorKANG, Hko
dc.contributor.authorPARK, KHko
dc.contributor.authorKIM, Cko
dc.contributor.authorSHIM, BSko
dc.contributor.authorKim, Sehunko
dc.contributor.authorMOON, DWko
dc.date.accessioned2013-02-25T22:35:49Z-
dc.date.available2013-02-25T22:35:49Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1992-04-
dc.identifier.citationNUCLEAR INSTRUMENTS METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v.67, no.1-4, pp.312 - 315-
dc.identifier.issn0168-583X-
dc.identifier.urihttp://hdl.handle.net/10203/65783-
dc.description.abstractIt is shown that point defects are predominantly generated by irradiating low energy noble gas ions onto a graphite(0001) surface. Scanning tunneling microscopic images of the graphite surface irradiated with 50 eV Ar+ ions show a structure corresponding to a point defect in which only one or two surface atoms are displaced. The process of ion penetration and trapping into the graphite is investigated as a function of ion energy in the range of 1-500 eV. Trapping efficiency rapidly increases with ion energy in the threshold region (10-100 eV), and leads to a saturation for higher energies. The penetration and trapping mechanism is discussed in relation to defect formation on the surface.-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE BV-
dc.subjectSCANNING TUNNELING MICROSCOPY-
dc.titlePOINT-DEFECT FORMATION ON GRAPHITE SURFACE INDUCED BY ION IMPACT AT ENERGIES NEAR PENETRATION THRESHOLD-
dc.typeArticle-
dc.identifier.wosidA1992HR30800066-
dc.identifier.scopusid2-s2.0-0005642229-
dc.type.rimsART-
dc.citation.volume67-
dc.citation.issue1-4-
dc.citation.beginningpage312-
dc.citation.endingpage315-
dc.citation.publicationnameNUCLEAR INSTRUMENTS METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS-
dc.contributor.localauthorKim, Sehun-
dc.contributor.nonIdAuthorKANG, H-
dc.contributor.nonIdAuthorPARK, KH-
dc.contributor.nonIdAuthorKIM, C-
dc.contributor.nonIdAuthorSHIM, BS-
dc.contributor.nonIdAuthorMOON, DW-
dc.type.journalArticleArticle; Proceedings Paper-
dc.subject.keywordPlusSCANNING TUNNELING MICROSCOPY-
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