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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Journal Papers(저널논문)

주기적 Sample Skipping과 표본화 주파수 축소에 의한 TDM 회선증가 방식에서의 왜곡 특성 해석

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안병성 / 김재균
Publisher
대한전자공학회
Issue Date
1975-06
Language
Korean
Citation

전자공학회지, v.12, no.3, pp.109 - 115

URI
http://hdl.handle.net/10203/65323
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