Measurement of Barkhausen Noise by Two Types of Probes in 3\% Silicon Steal.
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | D.G. Hwang | ko |
| dc.contributor.author | Ho Chul Kim | ko |
| dc.date.accessioned | 2013-02-25T18:31:02Z | - |
| dc.date.available | 2013-02-25T18:31:02Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1992 | - |
| dc.identifier.citation | 새물리, v.5 | - |
| dc.identifier.issn | 0374-4914 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/64335 | - |
| dc.language | Korean | - |
| dc.publisher | 한국물리학회 | - |
| dc.title | Measurement of Barkhausen Noise by Two Types of Probes in 3\% Silicon Steal. | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 5 | - |
| dc.citation.publicationname | 새물리 | - |
| dc.contributor.nonIdAuthor | D.G. Hwang | - |
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