DC Field | Value | Language |
---|---|---|
dc.contributor.author | J.D.Kim | ko |
dc.contributor.author | E.S.Lee | ko |
dc.date.accessioned | 2013-02-25T18:07:43Z | - |
dc.date.available | 2013-02-25T18:07:43Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1993 | - |
dc.identifier.citation | JOURNAL OF MATERIALS ENGINEERING AND PERFORMANCE, v.2, no.1, pp.113 - 118 | - |
dc.identifier.issn | 1059-9495 | - |
dc.identifier.uri | http://hdl.handle.net/10203/64195 | - |
dc.description.abstract | Chip breaker selection analysis, possible only through an experimental process, was obtained by a generalized equation that used an orthogonal cutting model and basic chip deformation. It could analyze the chip breaking phenomena without the use of an actual experimental method, and it was applied to computer simulation and proved the propriety of the theory through actual experiments. It derived the optimum conditions for chip breaking by applying the optimized theory to the basic program. A finite-element model for simulating chip breaking in orthogonal cutting was developed and discussed. By simulation, animation of the chip breaking process was observed on a computer screen. | - |
dc.language | English | - |
dc.publisher | Springer | - |
dc.title | A Study on the Phenomenon of Chip Breaking by Computer Analysis | - |
dc.type | Article | - |
dc.identifier.wosid | A1993KT38500011 | - |
dc.identifier.scopusid | 2-s2.0-51649133683 | - |
dc.type.rims | ART | - |
dc.citation.volume | 2 | - |
dc.citation.issue | 1 | - |
dc.citation.beginningpage | 113 | - |
dc.citation.endingpage | 118 | - |
dc.citation.publicationname | JOURNAL OF MATERIALS ENGINEERING AND PERFORMANCE | - |
dc.contributor.localauthor | J.D.Kim | - |
dc.contributor.nonIdAuthor | E.S.Lee | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | ANIMATION | - |
dc.subject.keywordAuthor | ATTACHED TYPE CHIP BREAKER | - |
dc.subject.keywordAuthor | CHIP BREAKING | - |
dc.subject.keywordAuthor | EQUIVALENT STRESS | - |
dc.subject.keywordAuthor | FINITE ELEMENT MODELING | - |
dc.subject.keywordAuthor | VONMISES YIELD CRITERION | - |
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