Automatic Testing pattern Generation for Nuclear Power Plant Digital Electronic Circuits
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Dae Sik | ko |
| dc.contributor.author | Seong, Poong-Hyun | ko |
| dc.date.accessioned | 2013-02-25T16:20:25Z | - |
| dc.date.available | 2013-02-25T16:20:25Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1994 | - |
| dc.identifier.citation | TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY, v.70, pp.339 - 340 | - |
| dc.identifier.issn | 0003-018X | - |
| dc.identifier.uri | http://hdl.handle.net/10203/63498 | - |
| dc.language | English | - |
| dc.publisher | American Nuclear Society | - |
| dc.title | Automatic Testing pattern Generation for Nuclear Power Plant Digital Electronic Circuits | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 70 | - |
| dc.citation.beginningpage | 339 | - |
| dc.citation.endingpage | 340 | - |
| dc.citation.publicationname | TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY | - |
| dc.contributor.localauthor | Seong, Poong-Hyun | - |
| dc.contributor.nonIdAuthor | Kim, Dae Sik | - |
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