An In-Process Measurement Technique Using Laser for Non-Contact Monitoring of Surface Roughness and Form Accuracy of Ground Surfaces

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 391
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorLee, C.S.ko
dc.contributor.authorKim, Seung-Wooko
dc.contributor.authorYim, D.Y.ko
dc.contributor.authorTönshoff, H.K.ko
dc.date.accessioned2013-02-25T15:26:08Z-
dc.date.available2013-02-25T15:26:08Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1987-
dc.identifier.citationCIRP ANNALS - MANUFACTURING TECHNOLOGY, v.36, no.1, pp.425 - 428-
dc.identifier.issn0007-8506-
dc.identifier.urihttp://hdl.handle.net/10203/63205-
dc.description.abstractAn optical in-process technique using laser for non-contact measurement of roughness and form accuracy of a ground surface is presented. Form accuracy is measured based on a triangulation method using a photodiode array, while surface roughness is monitored by analysing the radiational pattern of a laser beam from the surface. Detailed design aspects of a prototype measurement system built fully utilising modern opto-electronic instruments and its experimental results are discussed. © 1987 CIRP.-
dc.languageEnglish-
dc.publisherElsevier USA-
dc.titleAn In-Process Measurement Technique Using Laser for Non-Contact Monitoring of Surface Roughness and Form Accuracy of Ground Surfaces-
dc.typeArticle-
dc.identifier.scopusid2-s2.0-0023207339-
dc.type.rimsART-
dc.citation.volume36-
dc.citation.issue1-
dc.citation.beginningpage425-
dc.citation.endingpage428-
dc.citation.publicationnameCIRP ANNALS - MANUFACTURING TECHNOLOGY-
dc.contributor.localauthorKim, Seung-Woo-
dc.contributor.nonIdAuthorLee, C.S.-
dc.contributor.nonIdAuthorYim, D.Y.-
dc.contributor.nonIdAuthorTönshoff, H.K.-
dc.subject.keywordAuthoradaptive control-
dc.subject.keywordAuthorCCD photodiode array-
dc.subject.keywordAuthorform accuracy-
dc.subject.keywordAuthorground surface-
dc.subject.keywordAuthorIn-process optical measurement-
dc.subject.keywordAuthorlaser optics-
dc.subject.keywordAuthoroptical fiber-
dc.subject.keywordAuthoropto-electronics-
dc.subject.keywordAuthorsurface roughness-
Appears in Collection
ME-Journal Papers(저널논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0