DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, C.S. | ko |
dc.contributor.author | Kim, Seung-Woo | ko |
dc.contributor.author | Yim, D.Y. | ko |
dc.contributor.author | Tönshoff, H.K. | ko |
dc.date.accessioned | 2013-02-25T15:26:08Z | - |
dc.date.available | 2013-02-25T15:26:08Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1987 | - |
dc.identifier.citation | CIRP ANNALS - MANUFACTURING TECHNOLOGY, v.36, no.1, pp.425 - 428 | - |
dc.identifier.issn | 0007-8506 | - |
dc.identifier.uri | http://hdl.handle.net/10203/63205 | - |
dc.description.abstract | An optical in-process technique using laser for non-contact measurement of roughness and form accuracy of a ground surface is presented. Form accuracy is measured based on a triangulation method using a photodiode array, while surface roughness is monitored by analysing the radiational pattern of a laser beam from the surface. Detailed design aspects of a prototype measurement system built fully utilising modern opto-electronic instruments and its experimental results are discussed. © 1987 CIRP. | - |
dc.language | English | - |
dc.publisher | Elsevier USA | - |
dc.title | An In-Process Measurement Technique Using Laser for Non-Contact Monitoring of Surface Roughness and Form Accuracy of Ground Surfaces | - |
dc.type | Article | - |
dc.identifier.scopusid | 2-s2.0-0023207339 | - |
dc.type.rims | ART | - |
dc.citation.volume | 36 | - |
dc.citation.issue | 1 | - |
dc.citation.beginningpage | 425 | - |
dc.citation.endingpage | 428 | - |
dc.citation.publicationname | CIRP ANNALS - MANUFACTURING TECHNOLOGY | - |
dc.contributor.localauthor | Kim, Seung-Woo | - |
dc.contributor.nonIdAuthor | Lee, C.S. | - |
dc.contributor.nonIdAuthor | Yim, D.Y. | - |
dc.contributor.nonIdAuthor | Tönshoff, H.K. | - |
dc.subject.keywordAuthor | adaptive control | - |
dc.subject.keywordAuthor | CCD photodiode array | - |
dc.subject.keywordAuthor | form accuracy | - |
dc.subject.keywordAuthor | ground surface | - |
dc.subject.keywordAuthor | In-process optical measurement | - |
dc.subject.keywordAuthor | laser optics | - |
dc.subject.keywordAuthor | optical fiber | - |
dc.subject.keywordAuthor | opto-electronics | - |
dc.subject.keywordAuthor | surface roughness | - |
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