A Hybrid Shadow Testing Scheme During Ray Tracing
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | K.S.Eo | ko |
| dc.contributor.author | C.M.Kyung | ko |
| dc.date.accessioned | 2013-02-25T13:51:39Z | - |
| dc.date.available | 2013-02-25T13:51:39Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1989-03 | - |
| dc.identifier.citation | 전자공학회논문지, v.26, no.3, pp.402 - 411 | - |
| dc.identifier.issn | 1016-135X | - |
| dc.identifier.uri | http://hdl.handle.net/10203/62633 | - |
| dc.language | Korean | - |
| dc.publisher | 대한전자공학회 | - |
| dc.title | A Hybrid Shadow Testing Scheme During Ray Tracing | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 26 | - |
| dc.citation.issue | 3 | - |
| dc.citation.beginningpage | 402 | - |
| dc.citation.endingpage | 411 | - |
| dc.citation.publicationname | 전자공학회논문지 | - |
| dc.contributor.localauthor | C.M.Kyung | - |
| dc.contributor.nonIdAuthor | K.S.Eo | - |
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