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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Efficient double-filtering with a single acousto-optic tunable filter You, Jang-Woo; Ahn, Jeongho; Kim, Soohyun; Kim, D, OPTICS EXPRESS, v.16, no.26, pp.21505 - 21511, 2008-12 | |
Simultaneous measurement method of total and self-interference for the volumetric thickness-profilometer You, JW; Kim, D; Ryu, SY; Kim, Soohyun, OPTICS EXPRESS, v.17, no.3, pp.1352 - 1360, 2009-02 | |
White light on-axis digital holographic microscopy based on spectral phase shifting Kim, D; You, JW; Kim, Soohyun, OPTICS EXPRESS, v.14, no.1, pp.229 - 234, 2006-01 | |
Measurement of the thickness profile of a transparent thin film deposited upon a pattern structure with an acousto-optic tunable filter Kim, D; Kim, Soohyun; Kong, Hong-Jin; Lee, Y, OPTICS LETTERS, v.27, no.21, pp.1893 - 1895, 2002-11 | |
Direct spectral phase function calculation for dispersive interferometric thickness profilometry Kim, D; Kim, Soohyun, OPTICS EXPRESS, v.12, pp.5117 - 5124, 2004-10 |
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