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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| High speed volumetric thickness profile measurement based on full-field wavelength scanning interferometer You, Jang-Woo; Kim, Soohyun; Kim, Daesuk, OPTICS EXPRESS, v.16, no.25, pp.21022 - 21031, 2008-12 |
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