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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Frequency-dependent electrical and thermal response of heated atomic force microscope cantilevers Park, Keunhan; Lee, Jungchul; Zhang, Zhuomin M.; King, William P., JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, v.16, no.2, pp.213 - 222, 2007-04 | |
Nanotopographical imaging using a heated atomic force microscope cantilever probe Kim, K. J.; Park, K.; Lee, Jungchul; Zhang, Z. M.; King, W. P., SENSORS AND ACTUATORS A-PHYSICAL, v.136, no.1, pp.95 - 103, 2007-05 |
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