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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Measurement of Sub-micrometer Features Based on The Topographic Contrast Using Reflection Confocal Microscopy Lee, SeungWoo; Kang, DongKyun; Yoo, Hongki; Kim, TaeJoong; Gweon, Dae-Gab; Lee, Suk-Won; Kim, Kwang-Soo, Current Optics and Photonics, v.9, no.1, pp.26 - 31, 2005-03 | |
| Lateral Resolution Enhancement in Confocal Self-interference Microscopy with Commercial Calcite Plate Kang, DongKyun; Yoo, Hongki; Lee, Seungwoo; Gweon, Dae-Gab, Current Optics and Photonics, v.9, no.1, pp.32 - 35, 2005-03 |
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