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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Orthogonality correction of planar sample scanner for atomic force microscope Lee, DY; Lee, MY; Gweon, Dae-Gab, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, v.45, no.12-16, pp.L370 - L372, 2006-04 |
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