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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Alignment of laboratory-scale soft X-ray microscope using laser plasma Kang, Dong-Woo; Kang, Sung-Hoon; Kwon, Young-Man; Kim, Kyong-Woo; Yoo, Hongki; Kim, Tac-Hun; Gweon, Dae-Gab; Rah, Seung-Yu; Min, Jin-Young; Yoon, Kwon-Ha, JAPANESE JOURNAL OF APPLIED PHYSICS, v.46, no.1, pp.394 - 399, 2007-01 | |
| ABERRATION CORRECTED BEAM SCANNING STIMULATED EMISSION DEPLETION MICROSCOPY Yoo, Hongki; Song, Incheon; Gweon, Dae-Gab, INTERNATIONAL JOURNAL OF OPTOMECHATRONICS, v.2, no.4, pp.401 - 412, 2008 | |
| Lateral Resolution Enhancement in Confocal Self-interference Microscopy with Commercial Calcite Plate Kang, DongKyun; Yoo, Hongki; Lee, Seungwoo; Gweon, Dae-Gab, Current Optics and Photonics, v.9, no.1, pp.32 - 35, 2005-03 | |
| Confocal Scanning Microscopy : a High-Resolution Nondestructive Surface Profiler Yoo, Hongki; Lee, Seungwoo; Kang, Dongkyun; Kim, Taejoong; Gweon, Dae-Gab; Lee, Sukwon; Kim, Kwangsoo, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.7, no.4, pp.3 - 7, 2006-10 |
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