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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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A calibrated atomic force microscope using an orthogonal scanner and a calibrated laser interferometer Lee, Dong-Yeon; Kim, Dong-Min; Gweon, Dae-Gab; Park, Jinwon, APPLIED SURFACE SCIENCE, v.253, no.8, pp.3945 - 3951, 2007-02 | |
A new nano-accuracy AFM system for minimizing Abbe errors and the evaluation of its measuring uncertainty Kim, Dongmin; Lee, Dong Yeon; Gweon, Dae-Gab, ULTRAMICROSCOPY, v.107, no.4-5, pp.322 - 328, 2007-04 |
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