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NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
ABERRATION CORRECTED BEAM SCANNING STIMULATED EMISSION DEPLETION MICROSCOPY

Yoo, Hongki; Song, Incheon; Gweon, Dae-Gab, INTERNATIONAL JOURNAL OF OPTOMECHATRONICS, v.2, no.4, pp.401 - 412, 2008

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