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Frequency-comb-referenced multi-wavelength profilometry for largely stepped surfaces

Hyun, Sang-Won; Choi, Min-Ah; Chun, Byung-Jae; Kim, Seung-Man; Kim, Seung-Woo; KIM, Young-Jin, OPTICS EXPRESS, v.21, no.8, pp.9780 - 9791, 2013-04

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