Showing results 1 to 1 of 1
Fluorine passivation of vacancy defects in bulk germanium for Ge metal-oxide-semiconductor field-effect transistor application Jung, Woo-Shik; Park, Jin-Hong; Nainani, Aneesh; Nam, Donguk; Saraswat, Krishna C., APPLIED PHYSICS LETTERS, v.101, no.7, 2012-08 |
Discover