Browse "ME-Journal Papers(저널논문)" by Author Lee, Dong-Yeon
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| A calibrated atomic force microscope using an orthogonal scanner and a calibrated laser interferometer Lee, Dong-Yeon; Kim, Dong-Min; Gweon, Dae-Gab; Park, Jinwon, APPLIED SURFACE SCIENCE, v.253, no.8, pp.3945 - 3951, 2007-02 |
| Accurate Measurement of the Out-of-plane Motion of a Tip-scanning Atomic Force Microscope Lee, Dong-Yeon; Gweon, Dae-Gab, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.10, no.1, pp.119 - 121, 2009-01 |
| An education model of a nano-positioning system for mechanical engineers Lee, Dong-Yeon; Gweon, Dae-Gab, JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY, v.20, no.10, pp.1702 - 1715, 2006-10 |
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