Showing results 1 to 4 of 4
Advanced temperature compensation for piezoresistive sensors based on crystallographic orientation Chui, B. W.; Aeschimann, L.; Akiyama, T.; Staufer, U.; de Rooij, N. F.; Lee, Jungchul; Goericke, F.; et al, REVIEW OF SCIENTIFIC INSTRUMENTS, v.78, no.4, 2007-04 |
Local wettability modification by thermochemical nanolithography with write-read-overwrite capability Wang, D. B.; Szoszkiewicz, R.; Lucas, M.; Riedo, E.; Okada, T.; Jones, S. C.; Marder, S. R.; et al, APPLIED PHYSICS LETTERS, v.91, no.24, 2007-12 |
Nanotopographical imaging using a heated atomic force microscope cantilever probe Kim, K. J.; Park, K.; Lee, Jungchul; Zhang, Z. M.; King, W. P., SENSORS AND ACTUATORS A-PHYSICAL, v.136, no.1, pp.95 - 103, 2007-05 |
The effect of piezoresistive microcantilever geometry on cantilever sensitivity during surface stress chemical sensing Loui, A.; Goericke, F. T.; Ratto, T. V.; Lee, Jungchul; Hart, B. R.; King, W. P., SENSORS AND ACTUATORS A-PHYSICAL, v.147, no.2, pp.516 - 521, 2008-10 |
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