Browse "ME-Journal Papers(저널논문)" by Author Kim, Taejoong
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Chromatic confocal microscopy with a novel wavelength detection method using transmittance Kim, Taejoong; Kim, Sang Hoon; Do, DukHo; Yoo, Hongki; Gweon, Dae-Gab, OPTICS EXPRESS, v.21, no.5, pp.6286 - 6294, 2013-03 |
| Confocal Scanning Microscopy : a High-Resolution Nondestructive Surface Profiler Yoo, Hongki; Lee, Seungwoo; Kang, Dongkyun; Kim, Taejoong; Gweon, Dae-Gab; Lee, Sukwon; Kim, Kwangsoo, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.7, no.4, pp.3 - 7, 2006-10 |
| Enhancement of fluorescence confocal scanning microscopy lateral resolution by use of structured illumination Kim, Taejoong; Gweon, Dae-Gab; Lee, Jun-Hee, MEASUREMENT SCIENCE TECHNOLOGY, v.20, no.5, 2009-05 |
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