Browse "ME-Journal Papers(저널논문)" by Author Kim, Kwangsoo
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| Confocal Scanning Microscopy : a High-Resolution Nondestructive Surface Profiler Yoo, Hongki; Lee, Seungwoo; Kang, Dongkyun; Kim, Taejoong; Gweon, Dae-Gab; Lee, Sukwon; Kim, Kwangsoo, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.7, no.4, pp.3 - 7, 2006-10 |
| Three-dimensional surface profile measurement using a beam scanning chromatic confocal microscope Chun, Byung Seon; Kim, Kwangsoo; Gweon, Dae-Gab, REVIEW OF SCIENTIFIC INSTRUMENTS, v.80, no.7, 2009-07 |
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