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Nanotopographical imaging using a heated atomic force microscope cantilever probe Kim, K. J.; Park, K.; Lee, Jungchul; Zhang, Z. M.; King, W. P., SENSORS AND ACTUATORS A-PHYSICAL, v.136, no.1, pp.95 - 103, 2007-05 |
Piezoelectric cantilever voltage-to-frequency converter Lee, Seung Seob; White, RM, SENSORS AND ACTUATORS A-PHYSICAL, v.71, no.1-2, pp.153 - 157, 1998-11 |
Spray-Coated Liquid Metal Reflectors for Transparent Hydrogel Atomic Force Microscope Cantilevers Kim, Kwangseok; Kim, Seokbeom; Kim, Taehong; Kim, Wonjung; Lee, Jungchul, JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, v.25, no.5, pp.848 - 850, 2016-10 |
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