Showing results 4 to 7 of 7
Optical inspection of complex patterns of microelectronics products You, J.; Kim, Seung-Woo, CIRP ANNALS-MANUFACTURING TECHNOLOGY, v.57, no.1, pp.505 - 508, 2008 |
Pad Scratching in Chemical-Mechanical Polishing: The Effects of Mechanical and Tribological Properties Kim, Sanha; Saka, Nannaji; Chun, Jung-Hoon, ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, v.3, no.5, pp.P169 - P178, 2014-04 |
Solving the Controversy on the Wetting Transparency of Graphene Kim, Donggyu; Pugno, Nicola M.; Buehler, Markus J.; Ryu, Seunghwa, SCIENTIFIC REPORTS, v.5, 2015-10 |
Wetting theory for small droplets on textured solid surfaces Kim, Donggyu; Pugno, Nicola M.; Ryu, Seunghwa, SCIENTIFIC REPORTS, v.6, 2016-11 |
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