Showing results 6 to 8 of 8
Metrological atomic force microscopy integrated with a modified two-point diffraction interferometer Jin, Jonghan; Rhee, Hyug-Gyo; Kim, Seung-Woo, MEASUREMENT SCIENCE & TECHNOLOGY, v.20, no.10, 2009 |
Self-calibration algorithm for testing out-of-plane errors of two-dimensional profiling stages Yoo, SB; Kim, Seung-Woo, INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, v.44, no.7-8, pp.767 - 774, 2004-06 |
The development of a mobile robot equipped with a structured light range sensor Cha, YY; Gweon, Dae-Gab, INTELLIGENT AUTOMATION AND SOFT COMPUTING, v.4, no.4, pp.289 - 311, 1998 |
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