Browse "ME-Journal Papers(저널논문)" by Author Kim, Young-Duk
Showing results 7 to 8 of 8
| High speed 3D surface profile without axial scanning: dual-detection confocal reflectance microscopy Lee, Dongryoung; Kim, Young-Duk; Gweon, Dae-Gab; Yoo, Hongki, MEASUREMENT SCIENCE & TECHNOLOGY, v.25, no.12, 2014-12 |
| Multimodal confocal hyperspectral imaging microscopy with wavelength sweeping source Kim, Young-Duk; Do, Dukho; Yoo, Hongki; Gweon, Dae-Gab, MEASUREMENT SCIENCE TECHNOLOGY, v.26, no.2, 2015-02 |
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