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Showing results 1 to 4 of 4

1
Arbitrary N-Step Algorithm for Removal of Higher Order Test Optics Errors

Kim, Seung-Woo; Rhee, HG; Kim, BC, Proceedings of ASPE 1999 Annual Meeting, pp.433 - 436, ASPE, 1999-11

2
Metrological atomic force microscope using volumetric interferometer

Jin, J; Rhee, HG; Kim, Seung-Woo, 한국정밀공학회 한일심포지움, pp.313 - 316, 2003-11-27

3
Nano global positioning system

Kim, Seung-Woo; Rhee, HG; Chu, JY; Kim, Y, Proceedings of the 1st International Conference on Positioning Technology, pp.61 - 66, jspe, kspe, 2004-06

4
Volumetric Interferometer for 3-D Coordinate Measurement

Kim, Seung-Woo; Chu, J; Rhee, HG, EUSPEN, pp.234 - 235, 2004-05-06

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