Showing results 1 to 3 of 3
Equivalent Standard Deviation to Convert High-Reliability Model to Low-Reliability Model for Efficiency of Sampling-Based RBDO Lee, IkJin; Choi, Kyung K; David Gorsich, ARC conference, ARC, 2011-05-24 |
Sensitivity Analyses of FORM-Based and DRM-Based Performance Measure Approach for Reliability-Based Design Optimization Lee, IkJin; Choi. Kyung K; David Gorsich, ASME IDETC/DAC, ASME, 2008-08-04 |
System Reliability-Based Design Optimization Using MPP-Based Dimension Reduction Method Lee, IkJin; Choi, Kyung K; David Gorsich, AIAA/ISSMO, AIAA, 2008-09-11 |
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