DC Field | Value | Language |
---|---|---|
dc.contributor.author | LEE, SS | ko |
dc.contributor.author | Park, Kyu Ho | ko |
dc.date.accessioned | 2013-02-25T13:01:28Z | - |
dc.date.available | 2013-02-25T13:01:28Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1993-07 | - |
dc.identifier.citation | IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, v.E76D, no.7, pp.771 - 775 | - |
dc.identifier.issn | 0916-8532 | - |
dc.identifier.uri | http://hdl.handle.net/10203/62370 | - |
dc.description.abstract | In this paper, we present an efficient method for the fault simulation of the reconvergent fan-out stem. Our method minimizes the fault propagating region by analyzing the topology of the circuit, whose region is smaller than that of Tulip's.(1) The efficiency of our method is illustrated by experimental results for a set of benchmark circuits. | - |
dc.language | English | - |
dc.publisher | IEICE-INST ELECTRON INFO COMMUN ENG | - |
dc.title | AN EFFICIENT FAULT SIMULATION METHOD FOR RECONVERGENT FAN-OUT STEM | - |
dc.type | Article | - |
dc.identifier.wosid | A1993LP50300006 | - |
dc.type.rims | ART | - |
dc.citation.volume | E76D | - |
dc.citation.issue | 7 | - |
dc.citation.beginningpage | 771 | - |
dc.citation.endingpage | 775 | - |
dc.citation.publicationname | IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS | - |
dc.contributor.localauthor | Park, Kyu Ho | - |
dc.contributor.nonIdAuthor | LEE, SS | - |
dc.type.journalArticle | Article; Proceedings Paper | - |
dc.subject.keywordAuthor | FAULT SIMULATION | - |
dc.subject.keywordAuthor | RECONVERGENT FAN-OUT STEM | - |
dc.subject.keywordAuthor | COMBINATIONAL CIRCUIT | - |
dc.subject.keywordAuthor | PRIMARY STEM REGION | - |
dc.subject.keywordAuthor | EXIT LINE | - |
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