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Measurement of optical loss variation on thickness of InGaN optical confinement layers of blue-violet-emitting laser diodes

Son, J. K.; Lee, S. N.; Paek, H. S.; Sakong, T.; Kim, H. K.; Park, Y.; Ryu, H. Y.; et al, JOURNAL OF APPLIED PHYSICS, v.103, no.10, 2008-05

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